Ion-beam-induced structure fragmentation and dewetting in Au/Ti films

被引:1
|
作者
Codeco, C. F. S. [1 ]
Mello, S. L. A. [2 ]
Magnani, B. F. [1 ]
Sant'Anna, M. M. [1 ]
机构
[1] Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, RJ, Brazil
[2] Univ Fed Vicosa, Dept Fis, BR-36570900 Vicosa, MG, Brazil
关键词
Ion beam processing; Fragmentation; Microstructure formation; Solid-state dewetting; Gold thin films; PLASMON RESONANCE; THIN-FILMS; GOLD NANOPARTICLES; AU FILMS; SIZE; SUBSTRATE; NANOSTRUCTURES; FABRICATION; MORPHOLOGY; EVOLUTION;
D O I
10.1016/j.mtla.2021.101214
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigate the formation of Au structures by continuing fragmentation of a Au film separated from Si (100) substrate by a Ti adhesion layer. The ion-beam processing uses 2 keV Cs+ projectiles. It induces the formation of a large variety of structures with dimensions from tens of microns down to a few nanometers, and shapes that include flat Au islands and clusters of Au nanoparticles. We identify different fragmentation mechanisms. In one pathway, Au structures are formed as pinch-offdroplets detached from large Au islands undergoing solidstate dewetting. In a second pathway, a continuing cracking fragmentation produces Au structures with a wide range of sizes and shows self-similarity, expressed in a power law for volume distribution of fragments V-alpha with alpha= -2.03 +/- 0.05. The measured alpha value is consistent with theoretical results in the literature modeling strong impact fragmentation. In the last stage of fragmentation evolution, Au nanostructures are spread over a texturized Si background. They assume shapes close to hemispherical, reflecting the increasing relevance of surface tension as dimensions decrease.
引用
收藏
页数:10
相关论文
共 50 条
  • [1] Nanoscale pattern formation in Pt thin films due to ion-beam-induced dewetting
    Hu, XY
    Cahill, DG
    Averback, RS
    APPLIED PHYSICS LETTERS, 2000, 76 (22) : 3215 - 3217
  • [2] Patterning metallic nanostructures by ion-beam-induced dewetting and Rayleigh instability
    Lian, Jie
    Wang, Lumin
    Sun, Xiangchen
    Yu, Qingkai
    Ewing, Rodney C.
    NANO LETTERS, 2006, 6 (05) : 1047 - 1052
  • [3] ION-BEAM-INDUCED CONDUCTIVITY IN POLYMER-FILMS
    VENKATESAN, T
    FORREST, SR
    KAPLAN, ML
    MURRAY, CA
    SCHMIDT, PH
    WILKENS, BJ
    JOURNAL OF APPLIED PHYSICS, 1983, 54 (06) : 3150 - 3153
  • [4] PROXIMITY GETTERING OF AU TO ION-BEAM-INDUCED DEFECTS IN SILICON
    WONGLEUNG, J
    WILLIAMS, JS
    ELLIMAN, RG
    NYGREN, E
    EAGLESHAM, DJ
    JACOBSON, DC
    POATE, JM
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 96 (1-2): : 253 - 256
  • [5] Ion-beam-induced nanodots formation from Au/Si thin films on quartz surface
    Datta, D. P.
    Siva, V.
    Singh, A.
    Joshi, S. R.
    Kanjilal, D.
    Sahoo, P. K.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2016, 379 : 48 - 51
  • [6] ION-BEAM-INDUCED ATOMIC MIXING AND AMORPHIZATION IN TI/NI BILAYERED THIN-FILMS
    SAITO, K
    IWAKI, M
    JOURNAL OF APPLIED PHYSICS, 1984, 55 (12) : 4447 - 4449
  • [7] Characterization of mixed Ti/Al oxide thin films prepared by ion-beam-induced CVD
    Capitán, MJ
    Stabel, A
    Sánchez-Lopez, JC
    Justo, A
    González-Elipe, AR
    Lefebvre, S
    Fernández, A
    APPLIED SURFACE SCIENCE, 2000, 161 (1-2) : 209 - 218
  • [8] Ion-beam-induced phase separation in GeOx thin films
    Batra, Y.
    Kabiraj, D.
    Kumar, S.
    Kanjilal, D.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2007, 40 (15) : 4568 - 4570
  • [9] Ion-beam-induced stress reduction in refractory metal films
    Jain, Amitabh
    Surface and Coatings Technology, 1998, 103-104 (01): : 20 - 24
  • [10] Ion-beam-induced stress reduction in refractory metal films
    Jain, A
    SURFACE & COATINGS TECHNOLOGY, 1998, 104 : 20 - 24