IR-Drop Analysis of Graphene-Based Power Distribution Networks

被引:0
|
作者
Miryala, Sandeep [1 ]
Calimera, Andrea [1 ]
Macii, Enrico [1 ]
Poncino, Massimo [1 ]
机构
[1] Politecn Torino, Dipartimento Automat & Informat, I-10129 Turin, Italy
来源
DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2012) | 2012年
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Electromigration (EM) has been indicated as the killer effect for copper interconnects. ITRS projections show that for future technologies (22nm and beyond) the on-chip current demand will exceed the physical limit copper metal wires can tolerate. This represents a serious limitation for the design of power distribution networks of next generation ICs. New carbon nanomaterials, governed by ballistic transport, have shown higher immunity to EM, thereby representing potential candidate to replace copper. In this paper we make use of compact conductance models to benchmark Graphene Nanoribbons (GNRs) against copper. The two materials have been used to route a state-of-the-art multi-level power-grid architecture obtained through an industrial 45nm physical design flow. Although the adopted design style is optimized for metal grids, results obtained using our simulation framework show that GNRs, if properly sized, can outperform copper, thus allowing the design of reliable circuits with reduced IR-drop penalties.
引用
收藏
页码:81 / 86
页数:6
相关论文
共 50 条
  • [21] Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-drop Analysis
    Wen, Yihan
    Li, Juan
    Wang, Xiaoyi
    2023 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED DESIGN, ICCAD, 2023,
  • [22] IR-Drop Based Electromigration Assessment Parametric Failure Chip-Scale Analysis
    Sukharev, Valeriy
    Huang, Xin
    Chen, Hai-Bao
    Tan, Sheldon X. -D.
    2014 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2014, : 428 - 433
  • [23] Effect of IR-Drop on path delay testing using statistical analysis
    Liu, Chunsheng
    Wu, Yang
    Huang, Yu
    PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM, 2007, : 245 - +
  • [24] A Programmable Power Ground Network Optimization Flow Aiming at IR-drop Reduction
    Gong, Jiansong
    Wang, Xiaoxiao
    Ru, Songhao
    Su, Donglin
    PROCEEDINGS OF 2016 IEEE INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUITS AND MICROSYSTEMS (ICICM), 2016, : 15 - 19
  • [25] Analysis and Mitigation of IR-Drop Induced Scan Shift-Errors
    Holst, Stefan
    Schneider, Eric
    Kawagoe, Koshi
    Kochte, Michael A.
    Miyase, Kohei
    Wunderlich, Hans-Joachim
    Kajihara, Seiji
    Wen, Xiaoqing
    2017 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2017,
  • [26] Novel and efficient IR-Drop models for designing power distribution network for sub-100nm integrated circuits
    Bhooshan, Rishi
    ISQED 2007: PROCEEDINGS OF THE EIGHTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 2007, : 287 - 292
  • [27] Fast Variational Static IR-Drop Analysis on the Graphical Processing Unit
    Topaloglu, Rasit Onur
    2011 12TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), 2011, : 452 - 457
  • [28] Vector-based Dynamic IR-drop Prediction Using Machine Learning
    Chen, Jia-Xian
    Liu, Shi-Tang
    Wu, Yu-Tsung
    Wu, Mu-Ting
    Li, Chieo-Mo
    Chang, Norman
    Li, Ying-Shiun
    Chuang, Wen-Tze
    27TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC 2022, 2022, : 202 - 207
  • [29] Unveiling the Impact of IR-Drop on Performance Gain in NCFET-Based Processors
    Amrouch, Hussam
    Salamin, Sami
    Pahwa, Girish
    Gaidhane, Amol D.
    Henkel, Joerg
    Chauhan, Yogesh S.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 66 (07) : 3215 - 3223
  • [30] IR-drop modeling for measurement circuit of MEMS-based micro sensors
    Wang, R
    Cai, JQ
    Huang, ZF
    Wang, Y
    Sun, HP
    2003 5TH INTERNATIONAL CONFERENCE ON ASIC, VOLS 1 AND 2, PROCEEDINGS, 2003, : 1353 - 1356