Prior modelling and posterior sampling in impedance imaging
被引:29
作者:
Nicholls, GK
论文数: 0引用数: 0
h-index: 0
机构:
Univ Auckland, Dept Math, Auckland, New ZealandUniv Auckland, Dept Math, Auckland, New Zealand
Nicholls, GK
[1
]
Fox, C
论文数: 0引用数: 0
h-index: 0
机构:
Univ Auckland, Dept Math, Auckland, New ZealandUniv Auckland, Dept Math, Auckland, New Zealand
Fox, C
[1
]
机构:
[1] Univ Auckland, Dept Math, Auckland, New Zealand
来源:
BAYESIAN INFERENCE FOR INVERSE PROBLEMS
|
1998年
/
3459卷
关键词:
impedance tomography;
Markov chain Monte Carlo;
Bayesian;
Langevin;
inverse problem;
D O I:
10.1117/12.323791
中图分类号:
O29 [应用数学];
学科分类号:
070104 ;
摘要:
We examine sample based Bayesian inference from impedance imaging data. We report experiments employing low level pixel based priors with mixed discrete and continuous conductivities. Sampling is carried out using Metropolis-Hastings Markov chain Monte Carlo, employing both large scale, Langevin updates, and state-adaptive local updates. Computing likelihood ratios of conductivity distributions involves solving a second order linear partial differential equation. However our simulation is rendered computationally tractable by an update procedure which employs a linearization of the forward map and thereby avoids solving the PDE for those updates which are rejected.