Prior modelling and posterior sampling in impedance imaging

被引:29
作者
Nicholls, GK [1 ]
Fox, C [1 ]
机构
[1] Univ Auckland, Dept Math, Auckland, New Zealand
来源
BAYESIAN INFERENCE FOR INVERSE PROBLEMS | 1998年 / 3459卷
关键词
impedance tomography; Markov chain Monte Carlo; Bayesian; Langevin; inverse problem;
D O I
10.1117/12.323791
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
We examine sample based Bayesian inference from impedance imaging data. We report experiments employing low level pixel based priors with mixed discrete and continuous conductivities. Sampling is carried out using Metropolis-Hastings Markov chain Monte Carlo, employing both large scale, Langevin updates, and state-adaptive local updates. Computing likelihood ratios of conductivity distributions involves solving a second order linear partial differential equation. However our simulation is rendered computationally tractable by an update procedure which employs a linearization of the forward map and thereby avoids solving the PDE for those updates which are rejected.
引用
收藏
页码:116 / 127
页数:12
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