Quantifying the reduction in collected charge and soft errors in the presence of guard rings

被引：16

作者：

Narasimham, Balaji ^{[1
]}

Shuler, Robert L. ^{[2
]}

Black, Jeffrey D. ^{[1
]}

Bhuva, Bharat L. ^{[1
]}

Schrimpf, Ronald D. ^{[1
]}

Witulski, Arthur F. ^{[1
]}

Holman, William Timothy ^{[1
]}

Massengill, Lloyd W. ^{[1
]}

机构：

[1] Vanderbilt Univ, Nashville, TN 37235 USA

[2] NASA, Lyndon B Johnson Space Ctr, Avion Syst Div, Houston, TX 77058 USA

来源：

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 2008年 / 8卷 / 01期

关键词：

collected charge; guard rings (GRs); pulse-width; radiation hardening by design (RHBD); single event (SE); SE transient (SET); soft error; soft-error rate (SER);

D O I：

10.1109/TDMR.2007.912778

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Soft errors pose a major reliability threat to advanced electronic components and systems. Novel techniques are needed to mitigate the soft-error rate (SER) of integrated circuits (ICs), and in some cases, a combination of different mitigation techniques may be required for significant performance improvements. In this paper, an autonomous single-event-transient (SET) pulse-width characterization technique is used to quantify the effect of hardened-by-design structures, such as guard rings (GRs), in reducing the collected charge and SER of ICs. Experimental results obtained for a 0.35-mu m technology show a reduced SET pulse-width for devices with GRs; the corresponding reduction in SER was estimated to be greater than 55% for technologies ranging from 0.35 mu m to 70 nm.

引用

页码：203 / 209

页数：7

共 11 条

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