Analysis Method of High-Field Pinning Centers in NbTi Wires and MgB2 Wires

The main purpose of this article is to show an easier and more accurate method for analyzing high-field pinning centers. Previous methods did not allow for precise analysis and research on high-field pinning centers, they studied only the dominant pinning mechanism, and they required a maximum of pinning force (F-pmax) to analyze pinning centers. The main advantage of this method can be used in samples without the maximum pinning force required by other methods to analyze the pinning mechanism. In addition, this method allows us to observe even small changes in the density of individual pinning centers. This method is based on analysis of critical current density values in different ranges of reduced magnetic field. The method of analysis of high-field pinning centers allows primarily to develop methods and directions for creation of high-field pinning centers. The surface pinning centers are strong pinning centers in low magnetic fields and very weak pinning centers in middle and high magnetic fields. Additionally, the analysis of pinning centers shows that dislocations, strains, substitutions in the crystal lattice, and precipitation inside the grains create strong pinning centers in high magnetic fields and very weak pinning centers in low and middle magnetic fields. Research indicates that strains, substitutions in the crystal lattice, and precipitates inside grains form pinning centers that operate in the high magnetic field range.