Intrinsic Speed Limit of Negative Capacitance Transistors

被引:60
作者
Chatterjee, Korok [1 ]
Rosner, Alexander John [2 ]
Salahuddin, Sayeef [1 ]
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[2] Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA
关键词
Ferroelectric; hafnium oxide; kinetic inductance; negative capacitance; polarization response; simulation;
D O I
10.1109/LED.2017.2731343
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The emergence of negative capacitance as a way to limit power dissipation in CMOS logic transistors has raised the question of response delay of ferroelectric negative capacitance. Latency requirements for digital logic require a response time on the order of 10 ps or less. In this letter, we establish a coherent theoretical framework to analyze the delay between the clock edge at the gate and the response of the semiconductor channel in a ferroelectric negative capacitance transistor. The standard Landau-Khalatnikov equation approximates the slow, diffusive limit of the classical equation of motion. Therefore, using it to predict the response speed is unphysical. After extracting the damping and kinetic inductance from THz spectroscopy data, we simulate the full classical equation of motion and analyze the delay. We find that for doped hafnium oxides, the intrinsic delay is around 270 fs, far less than what is required for digital logic.
引用
收藏
页码:1328 / 1330
页数:3
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