X-ray Phase Contrast analysis - Digital wavefront development

被引:0
作者
Idir, Mourad [1 ]
Potier, Jonathan [1 ]
Fricker, Sebastien
Snigirev, Anatoly
Snigireva, Irina
Modi, M. H.
机构
[1] Synchrotron SOLEIL, Gif Sur Yvette, France
来源
SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION | 2010年 / 1234卷
关键词
curvature wavefront sensor; phase contrast; wavefront; metrology; SYNCHROTRON-RADIATION; TOMOGRAPHY; MICROTOMOGRAPHY;
D O I
10.1063/1.3463298
中图分类号
O59 [应用物理学];
学科分类号
摘要
Optical schemes that enable imaging of the phase shift produced by an object have become popular in the x-ray region, where phase can be the dominant contrast mechanism. The propagation-based technique consists of recording the interference pattern produced by choosing one or several sample-to-detector distances. Pioneering studies, carried out making use of synchrotron radiation, demonstrated that this technique results in a dramatic increase of image contrast and detail visibility, allowing the detection of structures invisible with conventional techniques(1,2). An experimental and theoretical study of in-line hard x-ray phase-contrast imaging had been performed. The theoretical description of the technique is based on Fresnel diffraction. As an illustration of the potential of this quantitative imaging technique, high-resolution x-ray phase contrast images of simple objects will be presented.
引用
收藏
页码:677 / +
页数:2
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