Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

被引：1
作者：
Weeks, BL
Barber, ZH
Raval, M
Welland, ME
Rayment, T
机构：
[1] Univ Cambridge, Dept Chem, Cambridge CB2 1EW, England
[2] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
[3] Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England
来源：
ULTRAMICROSCOPY | 2001年 / 87卷 / 1-2期
关键词：
scanning tunneling microscopy; STM; high temperature; in situ studies;
D O I：
10.1016/S0304-3991(00)00066-8
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A novel application of coated silica tips for use in high-pressure, high-temperature. scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：19 / 23
页数：5
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