Transmission electron microscopy investigation of Bi-2223/Ag tapes

被引：13
作者：
Andersen, LG
Bals, S
Van Tendeloo, G
Poulsen, HF
Liu, YL
机构：
[1] Riso Natl Lab, Dept Mat Res, DK-4000 Roskilde, Denmark
[2] Univ Antwerp, RUCA, EMAT, B-2020 Antwerp, Belgium
来源：
PHYSICA C | 2001年 / 353卷 / 3-4期
关键词：
Bi-2223; transmission electron microscopy; grain size; texture; intergrowth;
D O I：
10.1016/S0921-4534(00)01755-X
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The microstructure of (Bi,Pb)(2)Sr2Ca2CuOx (Bi-2223) tapes has been investigated by means of transmission electron microscopy (TEM) and high-resolution TEM. The emphasis has been placed on: (1) an examination of the grain morphology and size, (2) grain and colony boundary angles, which are formed during the tape processing, (3) a study of the grain boundaries on an atomic scale, including intergrowth investigations. Tapes with different process parameters have been compared with respect to the microstructure. A fully processed tape has on the average 50% thicker Bi-2223 grains than a tape after the first annealing. The angles of c-axis tilt grain boundaries are on average 14 degrees and 26 degrees for the fully processed tape and the tape after the first annealing, respectively. The intergrowth content(15%) and distribution are similar in these two tapes. (C) 2001 Elsevier Science B.V. All rights reserved.
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收藏
页码：251 / 257
页数：7
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