Direct deformation study of AFM probe tips modified by hydrophobic alkylsilane self-assembled monolayers

被引：11

作者：

Liu, Bernard Haochih ^{[1
]}

Chen, Cheng-Hsien ^{[1
]}

机构：

[1] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 70101, Taiwan

来源：

ULTRAMICROSCOPY | 2011年 / 111卷 / 08期

关键词：

Atomic force microscopy; Self-assembled monolayer; Wear; Hydrophobicity; Surface modification; Tip characterization; ATOMIC-FORCE MICROSCOPY; SCANNING PROBE; ANTI-STICTION; WEAR; REDUCTION; CAPILLARY;

D O I：

10.1016/j.ultramic.2011.03.020

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The in-use wear of atomic force microscopy (AFM) probe tips is crucial for the reliability of AFM measurements. Increase of tip size for several nanometers is difficult to monitor but it can already taint subsequent AFM data. We have developed a method to study the shape evolution of AFM probe tips in nanometer scale. This approach provides direct comparison of probe shape profiles, and thus can help in evaluation of the level of tip damage and quality of acquired AFM data. Consequently, the shape degradation of probes modified by hydrophobic alkylsilane self-assembled monolayers (SAMs) was studied. The tip wear length and wear volume were adopted to quantitatively verify the effectiveness of hydrophobic coatings. When compared with their silicon counterparts, probes modified by SAM materials exhibit superior wear-resistant behavior in tapping mode scans. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：1124 / 1130

页数：7

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