Loss Mechanisms and Optimum Design Methodology for Efficient mm-Waves Class-E PAs

被引：3
作者：
El-Aassar, Omar [1 ]
El-Nozahi, Mohamed [1 ]
Ragai, Hani Fikry [1 ]
机构：
[1] Ain Shams Univ, Elect & Commun Dept, Fac Engn, Cairo 11566, Egypt
来源：
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 2016年 / 63卷 / 06期
关键词：
Class-E PA; integrated CMOS IC; millimeter-waves; E POWER-AMPLIFIER;
D O I：
10.1109/TCSI.2016.2537999
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, loss mechanisms of monolithic high frequency Class-E PAs are studied. The switching behavior is analyzed to understand the discrepancy between common design equations and optimal design values as frequency scales up. Analytical results are verified by spice simulations. In addition, a design recipe based on loss analysis and effective output duty cycle is proposed for mm-waves PAs to boost their power added efficiency (PAE). The design approach is adopted to compare different technology nodes including the 130 nm, 90 nm, and 65 nm bulk CMOS. Newer technologies show better PAE only at the mm-waves regime. Simulations show that the PAE is boosted from 31% to 40% when the proposed design methodology is applied at 60 GHz using the 65 nm node.
引用
收藏
页码：773 / 784
页数：12
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