Sensitive and multiplexed analysis of aflatoxins using time-of-flight secondary ion mass spectrometry

被引:3
|
作者
Ahn, Jang-Hyuk [2 ]
Jeong, Young-Su [3 ]
Lee, Tae Geol [4 ]
Kim, Young-Pil [1 ]
Kim, Hak-Sung [3 ]
机构
[1] Hanyang Univ, Dept Life Sci, Seoul 133791, South Korea
[2] Namyang Dairy Co Ltd, R&D Inst, Food Safety Ctr, Gongju 314914, South Korea
[3] Korea Adv Inst Sci & Technol, Dept Biol Sci, Taejon 305701, South Korea
[4] KRISS, Ctr Nanobio Convergence, Taejon 305600, South Korea
关键词
Aflatoxin; TOF-SIMS; Quantification; Multiplexed analysis; SELF-ASSEMBLED MONOLAYERS; TOF-SIMS; QUANTITATIVE-ANALYSIS; SURFACE-ANALYSIS; B-1; PROTEIN; COLUMN; ELISA; HPLC; NANOPARTICLES;
D O I
10.1007/s13206-012-6105-8
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
A rapid and reliable analysis of toxins is prerequisite for food control and human healthcare. Here we demonstrate a simple and multiplexed assay of aflatoxins using time-of-flight secondary ion mass spectrometry (TOF-SIMS). By simply adsorbing either a single analyte or mixed ones onto a gold substrate, the corresponding secondary molecular ions ([M+H](+)) were clearly observed in a single mass spectrum. As a result of concentration-dependent peak intensity, quantitative and multiplexed analysis of different aflatoxin analogs from corns was accomplished with immunoaffinity column and TOF-SIMS analysis, which showed a good correlation with HPLC data. The detection sensitivity was estimated to be as low as 10 ng mL(-1) This approach presented here will find a wide application to detection of low-levels of toxins in a rapid and multiplexed way.
引用
收藏
页码:34 / 40
页数:7
相关论文
共 50 条
  • [41] Method for enhancing peptide signal in time-of-flight secondary ion mass spectrometry
    Naito, Junpei
    Satoh, Shuya
    Otsuka, Yoichi
    Hashimoto, Hiroyuki
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2012, 319 : 64 - 67
  • [42] Are cluster ion analysis beams good choices for hydrogen depth profiling using time-of-flight secondary ion mass spectrometry?
    Zhu, Zihua
    Shutthanandan, Vaithiyalingam
    SURFACE AND INTERFACE ANALYSIS, 2012, 44 (01) : 89 - 93
  • [43] Important aspects concerning the quantification of biomolecules by time-of-flight secondary-ion mass spectrometry
    Muddiman, DC
    Nicola, AJ
    Proctor, A
    Hercules, DM
    APPLIED SPECTROSCOPY, 1996, 50 (02) : 161 - 166
  • [44] Surface studies of heterogeneous catalysts by time-of-flight secondary ion mass spectrometry
    Grams, Jacek
    EUROPEAN JOURNAL OF MASS SPECTROMETRY, 2010, 16 (03) : 453 - 461
  • [45] Analysis of organic and inorganic species on the surface of atmospheric aerosol using time-of-flight secondary ion mass spectrometry (TOF-SIMS)
    Peterson, RE
    Tyler, BJ
    ATMOSPHERIC ENVIRONMENT, 2002, 36 (39-40) : 6041 - 6049
  • [46] Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry
    Drozdov, M. N.
    Drozdov, Y. N.
    Csik, A.
    Novikov, A. V.
    Vad, K.
    Yunin, P. A.
    Yurasov, D. V.
    Belykh, S. F.
    Gololobov, G. P.
    Suvorov, D. V.
    Tolstogouzov, A.
    THIN SOLID FILMS, 2016, 607 : 25 - 31
  • [47] Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization
    Hirata, K.
    Saitoh, Y.
    Chiba, A.
    Yamada, K.
    Narumi, K.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2013, 314 : 39 - 42
  • [48] Calculation of Membrane Lipid Ratios Using Single-Pixel Time-of-Flight Secondary Ion Mass Spectrometry Analysis
    Kassenboehmer, Rainer
    Draude, Felix
    Koersgen, Martin
    Pelster, Andreas
    Arlinghaus, Heinrich F.
    ANALYTICAL CHEMISTRY, 2015, 87 (15) : 7795 - 7802
  • [49] Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis
    Cossement, Damien
    Renaux, Fabian
    Thiry, Damien
    Ligot, Sylvie
    Francq, Remy
    Snyders, Rony
    APPLIED SURFACE SCIENCE, 2015, 355 : 842 - 848
  • [50] Detecting changes in arabidopsis cell wall composition using time-of-flight secondary ion mass spectrometry
    Tsai, Alex Yi-Lin
    Goacher, Robyn E.
    Master, Emma R.
    SURFACE AND INTERFACE ANALYSIS, 2015, 47 (05) : 626 - 631