Sensitive and multiplexed analysis of aflatoxins using time-of-flight secondary ion mass spectrometry

被引:3
|
作者
Ahn, Jang-Hyuk [2 ]
Jeong, Young-Su [3 ]
Lee, Tae Geol [4 ]
Kim, Young-Pil [1 ]
Kim, Hak-Sung [3 ]
机构
[1] Hanyang Univ, Dept Life Sci, Seoul 133791, South Korea
[2] Namyang Dairy Co Ltd, R&D Inst, Food Safety Ctr, Gongju 314914, South Korea
[3] Korea Adv Inst Sci & Technol, Dept Biol Sci, Taejon 305701, South Korea
[4] KRISS, Ctr Nanobio Convergence, Taejon 305600, South Korea
关键词
Aflatoxin; TOF-SIMS; Quantification; Multiplexed analysis; SELF-ASSEMBLED MONOLAYERS; TOF-SIMS; QUANTITATIVE-ANALYSIS; SURFACE-ANALYSIS; B-1; PROTEIN; COLUMN; ELISA; HPLC; NANOPARTICLES;
D O I
10.1007/s13206-012-6105-8
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
A rapid and reliable analysis of toxins is prerequisite for food control and human healthcare. Here we demonstrate a simple and multiplexed assay of aflatoxins using time-of-flight secondary ion mass spectrometry (TOF-SIMS). By simply adsorbing either a single analyte or mixed ones onto a gold substrate, the corresponding secondary molecular ions ([M+H](+)) were clearly observed in a single mass spectrum. As a result of concentration-dependent peak intensity, quantitative and multiplexed analysis of different aflatoxin analogs from corns was accomplished with immunoaffinity column and TOF-SIMS analysis, which showed a good correlation with HPLC data. The detection sensitivity was estimated to be as low as 10 ng mL(-1) This approach presented here will find a wide application to detection of low-levels of toxins in a rapid and multiplexed way.
引用
收藏
页码:34 / 40
页数:7
相关论文
共 50 条
  • [31] Quantifying the Molar Percentages of Cholesterol in Supported Lipid Membranes by Time-of-Flight Secondary Ion Mass Spectrometry and Multivariate Analysis
    Wilson, Robert L.
    Kraft, Mary L.
    ANALYTICAL CHEMISTRY, 2013, 85 (01) : 91 - 97
  • [32] Quantification of organic additives on polymer surfaces by time-of-flight secondary ion mass spectrometry with gold deposition
    Murase, Atsushi
    Kato, Yuichi
    Sudo, Eiichi
    APPLIED SURFACE SCIENCE, 2020, 509
  • [33] The localization of the alkaloids in Coptis chinensis rhizome by time-of-flight secondary ion mass spectrometry
    He, Fan
    Huang, Yu-Feng
    Dai, Wei
    Qu, Xian-You
    Lu, Jing-Guang
    Lao, Chi-Chou
    Luo, Wen-Hui
    Sun, Dong-Mei
    Wei, Mei
    Xiao, Sheng-Yuan
    Xie, Ying
    Liu, Liang
    Zhou, Hua
    FRONTIERS IN PLANT SCIENCE, 2022, 13
  • [34] Time-of-flight secondary ion mass spectrometry analysis of hair samples using unsupervised artificial neural network
    Matsuda, Kazuhiro
    Aoyagi, Satoka
    BIOINTERPHASES, 2020, 15 (02)
  • [35] Application of Time-of-flight Secondary Ion Mass Spectrometry in Lithium-ion Batteries
    Li, Pengwei
    Xia, Xiaoning
    CURRENT ANALYTICAL CHEMISTRY, 2025, 21 (01) : 1 - 4
  • [36] Chemical Imaging of Fingerprint on RMB Banknotes Using Time-of-Flight Secondary Ion Mass Spectrometry
    Li, Wen-Jie
    Sun, Ling-Hui
    You, Wei
    Wang, Li-Xue
    Zhao, Ya-Bin
    Li, Zhan-Ping
    CHINESE JOURNAL OF ANALYTICAL CHEMISTRY, 2020, 48 (11) : 1511 - 1518
  • [37] Spectral characterization of ten cyclic lipids using time-of-flight secondary ion mass spectrometry
    Leefmann, Tim
    Heim, Christine
    Siljestrom, Sandra
    Blumenberg, Martin
    Sjovall, Peter
    Thiel, Volker
    RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 2013, 27 (05) : 565 - 581
  • [38] Preserving the structure of adsorbed protein films for time-of-flight secondary ion mass spectrometry analysis
    Xia, N
    Castner, DG
    JOURNAL OF BIOMEDICAL MATERIALS RESEARCH PART A, 2003, 67A (01): : 179 - 190
  • [39] A preliminary comparison of time-of-flight laser ionization and secondary ion mass spectrometry in solids analysis
    Xu, Zhouyi
    Hang, Le
    Lu, Qiao
    Guo, Ning
    Hang, Wei
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2020, 167 (167)
  • [40] Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry
    Lee, Y
    Han, S
    Kwon, MH
    Lim, H
    Kim, YS
    Chun, H
    Kim, JS
    APPLIED SURFACE SCIENCE, 2003, 203 : 875 - 879