Thickness Dependence of Electronic Structure and Optical Properties of F8BT Thin Films

被引:13
作者
Ghasemi, Bita [1 ]
Sevcik, Jakub [1 ]
Nadazdy, Vojtech [2 ]
Vegso, Karol [2 ]
Siffalovic, Peter [2 ]
Urbanek, Pavel [1 ]
Kuritka, Ivo [1 ]
机构
[1] Tomas Bata Univ Zlin, Ctr Polymer Syst, Tr Tomase Bati 5678, CZ-76001 Zlin, Czech Republic
[2] Slovak Acad Sci, Inst Phys, Dubravska Cesta 9, SK-84511 Bratislava, Slovakia
关键词
F8BT; thin films; chain ordering; J- and H-aggregates; ER-EIS; MICROWAVE-ASSISTED SYNTHESIS; PACKING STRUCTURE; CHARGE-TRANSPORT; MEH-PPV; POLYMER; DISORDER; MOBILITY;
D O I
10.3390/polym14030641
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Electronic devices based on polymer thin films have experienced a tremendous increase in their efficiency in the last two decades. One of the critical factors that affects the efficiency of polymer solar cells or light emitting devices is the presence of structural defects that controls non-radiative recombination. The purpose of this report is to demonstrate a non-trivial thickness dependence of optoelectronic properties and structure (dis)order in thin conductive poly(9,9-dioctyfluorene-alt-benzothiadiazole), F8BT, polymer films. The UV-Vis absorption spectra exhibited blue shift and peak broadening; significant changes in 0-0 and 0-1 radiative transition intensity was found in photoluminescence emission spectra. The density of state (DOS) was directly mapped by energy resolved-electrochemical impedance spectroscopy (ER-EIS). Satellite states 0.5 eV below the lowest unoccupied molecular orbital (LUMO) band were revealed for the thinner polymer films. Moreover, the decreasing of the deep states density in the band gap manifested an increment in the material structural ordering with increasing thickness. Changes in the ratio between crystalline phases with face-on and edge-on orientation of F8BT chains were identified in the films by grazing-incidence wide angle X-ray scattering technique. A thickness threshold in all investigated aspects of the films at a thickness of about 100 nm was observed that can be attributed to the development of J-H aggregation in the film structure and mutual interplay between these two modes. Although a specific structure-property relationship thickness threshold value may be expected for thin films prepared from various polymers, solvents and under different process conditions, the value of about 100 nm can be generally considered as the characteristic length scale of this phenomenon.
引用
收藏
页数:13
相关论文
共 50 条
[41]   Impact of surface morphology and thickness of tin selenide thin films on their optical properties [J].
Ivanauskas, Remigijus ;
Kunciute, Aiste ;
Ancutiene, Ingrida ;
Andrulevicius, Mindaugas ;
Mikolajunas, Marius .
SURFACES AND INTERFACES, 2022, 28
[42]   Microstructural and optical properties investigation of variable thickness of Tin Telluride thin films [J].
Tanwar, Praveen ;
Panwar, Amrish K. ;
Singh, Sukhvir ;
Srivatava, A. K. .
THIN SOLID FILMS, 2020, 693
[43]   Influence of Thickness on Optical Properties of a: As2Se3 Thin Films [J].
Sati, Dinesh Chandra ;
Kumar, Rajendra ;
Mehra, Ram Mohan .
TURKISH JOURNAL OF PHYSICS, 2006, 30 (06) :519-527
[44]   Impacts of thickness reduction and heat treatment on the optical properties of thin chalcogenide films [J].
Adam, A. M. ;
Petkov, P. .
CERAMICS INTERNATIONAL, 2017, 43 (14) :11015-11022
[45]   Thickness dependent structural, morphological and optical properties of molybdenum oxide thin films [J].
Sudesh Kumari ;
Kamaljit Singh ;
Palwinder Singh ;
Sanjay Kumar ;
Anup Thakur .
SN Applied Sciences, 2020, 2
[46]   Studies on the electronic transport and optical properties of some new chelate modified polysulfones in thin films [J].
Rusu, GI ;
Airinei, A ;
Baban, C ;
Rusu, GG ;
Mardare, D ;
Rusu, M .
JOURNAL OF APPLIED POLYMER SCIENCE, 2006, 99 (01) :100-106
[47]   Modification of optical properties and structure of thin films for enhancing absorption [J].
Lysiuk, V. O. .
SEMICONDUCTOR PHYSICS QUANTUM ELECTRONICS & OPTOELECTRONICS, 2014, 17 (02) :209-212
[48]   Influence of thermal annealing on microstructural, morphological, optical properties and surface electronic structure of copper oxide thin films [J].
Akgul, Funda Aksoy ;
Akgul, Guvenc ;
Yildirim, Nurcan ;
Unalan, Husnu Emrah ;
Turan, Rasit .
MATERIALS CHEMISTRY AND PHYSICS, 2014, 147 (03) :987-995
[49]   Electronic structure and optical properties of inverse-spinel MnCo2O4 thin films [J].
Kwang Joo Kim ;
Jong Wook Heo .
Journal of the Korean Physical Society, 2012, 60 :1376-1380
[50]   Insight into electronic structure and optical properties of ZnTPP thin films for energy conversion applications: Experimental and computational study [J].
AlSaidi, Ramadhan A. M. ;
Alamri, Hatem R. ;
Sharma, Kamal ;
Al-Muntaser, A. A. .
MATERIALS TODAY COMMUNICATIONS, 2022, 32