Tantalum doping in HfO2: orthorhombic phase formation at ambient conditions and change in path of pressure-induced structural evolution

被引：5

作者：

Pathak, S. ^{[1
,2
]}

Das, P. ^{[1
,2
]}

Sahu, M. ^{[2
,3
]}

Pandey, K. L. ^{[3
]}

Mandal, G. ^{[4
]}

Patkare, G. R. ^{[5
]}

机构：

[1] Variable Energy Cyclotron Ctr, Expt Nucl Phys Div, Kolkata 700064, India

[2] Homi Bhabha Natl Inst, Mumbai 400094, Maharashtra, India

[3] Bhabha Atom Res Ctr, Radioanalyt Chem Div, Mumbai, Maharashtra, India

[4] Jadavpur Univ, Ctr Rural & Cryogen Technol, Kolkata, India

[5] Bhabha Atom Res Ctr, Tech Phys Div, Mumbai, Maharashtra, India

来源：

HIGH PRESSURE RESEARCH | 2020年 / 40卷 / 03期

关键词：

Structural phase transformation; high pressure; X-ray diffraction; synchrotron radiation; crystal structure; X-RAY-DIFFRACTION; ZRO2; HAFNIA; ZIRCONIA;

D O I：

10.1080/08957959.2020.1765338

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A systematic study of orthorhombic phase formation at ambient conditions beyond a critical concentration of dopant Tantalum (Ta) in HfO is reported. The effect on the path of structural evolution due to Ta doping in HfO was also investigated. Studies on Ta-doped HfO samples and their path of structural evolution under compression have significant implications for materials undergoing beta-decay. The effect of continual doping due to beta-decay from geophysical point of view is discussed.

引用

页码：434 / 443

页数：10

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