Correlation lengths, porosity and water adsorption in TiO2 thin films prepared by glancing angle deposition

被引：64

作者：

Gonzalez-Garcia, Lola ^{[1
]}

Parra-Barranco, Julian ^{[1
]}

Sanchez-Valencia, Juan R. ^{[1
]}

Barranco, Angel ^{[1
]}

Borras, Ana ^{[1
]}

Gonzalez-Elipe, Agustin R. ^{[1
]}

Garcia-Gutierrez, Mari-Cruz ^{[2
]}

Hernandez, Jaime J. ^{[2
]}

Rueda, Daniel R. ^{[2
]}

Ezquerra, Tiberio A. ^{[2
]}

机构：

[1] Univ Seville, CSIC, Inst Ciencia Mat Sevilla, Seville 41092, Spain

[2] CSIC, Inst Estruct Mat, E-28006 Madrid, Spain

来源：

NANOTECHNOLOGY | 2012年 / 23卷 / 20期

关键词：

SENSITIZED SOLAR-CELLS; X-RAY-SCATTERING; OPTICAL-PROPERTIES; LAYERS; INDEX;

D O I：

10.1088/0957-4484/23/20/205701

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

This paper reports a thorough microstructural characterization of glancing angle deposited (GLAD) TiO2 thin films. Atomic force microscopy (afm), grazing-incidence small-angle x-ray scattering (GISAXS) and water adsorption isotherms have been used to determine the evolution of porosity and the existence of some correlation distances between the nanocolumns constituting the basic elements of the film's nanostructure. It is found that the deposition angle and, to a lesser extent, the film thickness are the most important parameters controlling properties of the thin film. The importance of porosity and some critical dimensions encountered in the investigated GLAD thin films is highlighted in relation to the analysis of their optical properties when utilized as antireflective coatings or as hosts and templates for the development of new composite materials.

引用

页数：10

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