Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC waveform digitizer

被引:29
作者
Breton, D. [1 ]
De Cacqueray, V. [2 ,7 ]
Delagnes, E. [2 ]
Grabas, H. [3 ]
Maalmi, J. [1 ]
Minafra, N. [4 ,5 ,6 ]
Royon, C. [6 ]
Saimpert, M. [2 ]
机构
[1] Univ Paris Saclay, CNRS LAL Orsay IN2P3, F-91898 Orsay, France
[2] Univ Paris Saclay, CEA, IRFU, F-91191 Gif Sur Yvette, France
[3] UC Santa Cruz, Santa Cruz Inst Particle Phys, Santa Cruz, CA 95064 USA
[4] Dipartimento Interateneo Fis Bari, Bari, Italy
[5] CERN, Geneva, Switzerland
[6] Univ Kansas, Lawrence, KS 66045 USA
[7] Univ Paris Saclay, CEA, LSCE, F-91191 Gif Sur Yvette, France
关键词
ASIC; Time-of-flight; Time to digital converter; Waveform sampling; Time resolution; Silicon detector; TIME MEASUREMENTS;
D O I
10.1016/j.nima.2016.08.019
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to improve time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using pulses generated by a signal generator or by a silicon detector illuminated by a pulsed infrared laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 ps with synthesized signals and 40 ps with silicon detector signals. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:51 / 60
页数:10
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