Recombination statistics and kinetics in semiconductor nanostructures

被引:2
|
作者
Sachenko, AV [1 ]
Kryuchenko, YV [1 ]
机构
[1] Natl Acad Sci Ukraine, Inst Semicond Phys, UA-03028 Kiev, Ukraine
关键词
D O I
10.1134/1.1641140
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A new approach to describing the observed features of recombination in semiconductor nanostructures is suggested. In addition to radiative exciton recombination, a nonradiative channel of exciton Auger recombination involving local interface states is taken into account. Recombination statistics and kinetics in semiconductor nanocrystals are considered both for low and high densities of local interface states. The case of a low excitation level, where a statistical approach to recombination in isolated nanocrystals is no longer valid, is analyzed. It is shown that the presence of nonradiative exciton Auger recombination accounts both for the linear dependence of photoluminescence intensity on the excitation level and for the low photoluminescence quantum efficiency. (C) 2004 MAIK "Nauka / Interperiodica".
引用
收藏
页码:99 / 106
页数:8
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