Dose rate, total dose and neutron radiation testing of COTS and military microcircuit devices

被引：1
|
作者：
Mulford, SG [1 ]
机构：
[1] Raytheon Co, Sudbury, MA 01776 USA
来源：
1998 IEEE RADIATION EFFECTS DATA WORKSHOP | 1998年
关键词：
D O I：
10.1109/REDW.1998.731484
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
Radiation testing on a variety of Commercial Off the Shelf (COTS) and military devices has been performed for the prompt narrow and wide pulse dose rate, total dose gamma and neutron environments. Many of the devices reported on are those used for microprocessor and processor peripheral support applications.
引用
收藏
页码：91 / 95
页数：5
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