Local Characterization of Ferromagnetic Resonance in Bulk and Patterned Magnetic Materials Using Scanning Microwave Microscopy

被引:3
作者
Joseph, Christopher Hardly [1 ,2 ]
Gramse, Georg [3 ]
Proietti, Emanuela [1 ]
Sardi, Giovanni Maria [1 ]
Morley, Gavin W. [4 ]
Kienberger, Ferry [5 ]
Bartolucci, Giancarlo [1 ,6 ]
Marcelli, Romolo [1 ]
机构
[1] Natl Res Council CNR, Inst Microelect & Microsyst, IMM, I-00133 Rome, Italy
[2] Univ Politecn Marche, Dept Informat Engn, I-60131 Ancona, Italy
[3] Johannes Kepler Univ Linz, Inst Biophys, A-4020 Linz, Austria
[4] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[5] Keysight Technol Austria GmbH, Measurement & Res Lab, A-4020 Linz, Austria
[6] Univ Roma Tor Vergata, Dept Elect Engn, I-00133 Rome, Italy
关键词
Perpendicular magnetic anisotropy; Magnetostatics; Microstrip; Magnetic field measurement; Magnetic resonance imaging; Microwave oscillators; Microwave imaging; Ferromagnetic resonance (FMR); magnetostatic modes; permalloy (Py); scanning microwave microscopy (SMM); yttrium iron garnet (YIG); NANOSCALE CHARACTERIZATION; DRIVEN; WAVES;
D O I
10.1109/TIM.2022.3142760
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have demonstrated the capabilities of the scanning microwave microscopy (SMM) technique for measuring ferromagnetic resonance (FMR) spectra in nanometric areas of magnetic samples. The technique is evaluated using three different samples, including a yttrium iron garnet (YIG) polycrystalline bulk sample and a thick YIG film grown by liquid phase epitaxy (LPE). Patterned permalloy (Py) micromagnetic dots have been characterized to assess the performance for imaging applications of the technique, measuring the variation of the magnetic properties of the sample along its surface. The proposed technique may pave the way for the development of high spatially resolved mapping of magnetostatic modes in different nanomagnetic and micromagnetic structures.
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页数:11
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