Structure of Strained Low-Dimensional Sb by In Situ Surface X-Ray Diffraction

被引：0

作者：

Mousley, Philip J. ^{[1
]}

Burrows, Christopher W. ^{[1
]}

Nicklin, Chris ^{[1
]}

Bell, Gavin R. ^{[2
]}

机构：

[1] Diamond Light Source, Harwell Sci Innovat Campus, Didcot OX11 0DE, Oxon, England

[2] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England

来源：

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2022年 / 259卷 / 04期

关键词：

antimony; crystallography; strains; surface X-ray diffraction; topological materials; MOLECULAR-BEAM EPITAXY; ACCUMULATION LAYER; CRYSTAL-STRUCTURE; THIN-FILM; GROWTH; SB(111); RECONSTRUCTION; ANTIMONY; SB/GASB;

D O I：

10.1002/pssb.202100432

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Antimony ultrathin films in tensile strain are grown on InAs(111)B substrates and studied in situ using surface X-ray diffraction. The detailed atomic structures of two highly crystalline Sb(0001) films are derived, with thicknesses of 19 and 4 bilayers. Features considered in structural modeling include interfacial intermixing, surface roughness, individual layer relaxations, and rotational twin domains (RTDs). The four-bilayer film shows significant structural relaxation in every layer, while both films include RTDs. The results are discussed in relation to the topological properties of low-dimensional Sb.

引用

页数：11

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