Measurement of aluminum oxide film by Fabry-Perot interferometry and scanning electron microscopy

被引：6

作者：

Karim, Farzia ^{[1
]}

Bora, Tanujjal ^{[1
]}

Chaudhari, Mayur ^{[1
]}

Habib, Khaled ^{[2
]}

Mohammed, Waleed ^{[3
]}

Dutta, Joydeep ^{[4
]}

机构：

[1] Asian Inst Technol, Sch Engn & Technol, Ctr Excellence Nanotechnol, Pathum Thani 12120, Thailand

[2] KISR, EBR Ctr, RE Program, Mat Sci & Photoelect Lab, POB 24885, Kuwait 13109, Kuwait

[3] Bangkok Univ, Sch Engn, Ctr Res Optoelect Commun & Control Syst, Bangkok, Thailand

[4] Sultan Qaboos Univ, Water Res Ctr, Chair Nanotechnol, POB 17, Al Khoud 123, Oman

来源：

JOURNAL OF SAUDI CHEMICAL SOCIETY | 2017年 / 21卷 / 08期

关键词：

Aluminun; Aluminum oxide film; Fabry-Perot interferometry; Sulfuric acid; Scanning electron microscopy (SEM); Direct current (DC); electrochemical method; RESISTANCE; SAMPLES;

D O I：

10.1016/j.jscs.2016.02.001

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A novel experimental scheme for real time measurement of aluminum oxide film during anodization was developed for the first time. The scheme was established based on a combination of a fiber optic sensor of Fabry-Perot interferometry and direct current (DC) electrochemical methods. The scheme was assembled in a way to simultaneously anodize the aluminum samples and to measure the thickness of the aluminum oxide film. The anodization process of aluminum sample was carried out in 4% sulfuric acid (H2SO4) solution by the DC methods at room temperature. The estimated thickness of the aluminum oxide film by the novel scheme was verified by scanning electron microscopy (SEM) and electrochemistry measurements. This study shows that real time measurement of the thickness of aluminum oxide film is feasible as it closely matched the thickness determined by SEM and other electrochemistry techniques. (C) 2016 King Saud University. Production and hosting by Elsevier B.V.

引用

页码：938 / 942

页数：5

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