Al/Ti/4H-SiC Schottky barrier diodes with inhomogeneous barrier heights

被引:16
|
作者
Wang Yue-Hu [1 ]
Zhang Yi-Men
Zhang Yu-Ming
Song Qing-Wen
Jia Ren-Xu
机构
[1] Xidian Univ, Sch Microelect, Xian 710071, Peoples R China
基金
中国国家自然科学基金;
关键词
Schottky contact; 4H-SiC; barrier height inhomogeneity; temperature;
D O I
10.1088/1674-1056/20/8/087305
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
This paper investigates the current-voltage (I-V) characteristics of Al/Ti/4H-SiC Schottky barrier diodes (SBDs) in the temperature range of 77 K-500 K, which shows that Al/Ti/4H-SiC SBDs have good rectifying behaviour. An abnormal behaviour, in which the zero bias barrier height decreases while the ideality factor increases with decreasing temperature (T), has been successfully interpreted by using thermionic emission theory with Gaussian distribution of the barrier heights due to the inhomogeneous barrier height at the Al/Ti/4H-SiC interface. The effective Richardson constant A* = 154 A/cm(2) . K-2 is determined by means of a modified Richardson plot ln(I-0/T-2) - (q sigma)(2)/2(kT)(2) versus q/kT, which is very close to the theoretical value 146 A/cm(2) . K-2.
引用
收藏
页数:5
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