Measurements of metal-polymer adhesion properties with dynamic force spectroscopy

被引：12
|
作者：
Schirmeisen, A
Weiner, D
Fuchs, H
机构：
[1] Univ Munster, Inst Phys, D-48149 Munster, Germany
[2] CeNTech, Ctr Nanotechnol, D-48149 Munster, Germany
来源：
SURFACE SCIENCE | 2003年 / 545卷 / 03期
关键词：
atomic force microscopy; adhesion; surface chemical reaction; surface energy; aluminum;
D O I：
10.1016/j.susc.2003.09.013
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We investigate nanoscale interface properties using dynamic mode atomic force microscopy (AFM) operated in the frequency modulation mode in ultrahigh vacuum. The AFM tip was was functionalised by a thin layer of aluminium and the polymer was treated by plasma-etching. In the spectroscopy mode we could measure the adhesion properties between the metal and the polymer surfaces. We found that plasma-etching of the polymer resulted in strongly enhanced force interactions, indicating a chemical activation of the polymer surface. Values for the adhesion force and work of adhesion were measured on the nanometer scale and are compared to conventional macroscopic adhesion failure tests. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码：155 / 162
页数：8
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