Effects of antioxidants on the initiation and growth of electrical trees in XLPE

被引：12

作者：

Sekii, Y ^{[1
]}

Tanaka, D ^{[1
]}

Saito, M ^{[1
]}

Chizuwa, N ^{[1
]}

Karasawa, K ^{[1
]}

机构：

[1] Chiba Inst Technol, Narashino, Chiba, Japan

来源：

2003 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA | 2003年

关键词：

D O I：

10.1109/CEIDP.2003.1254941

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Experiments were carried out using cross-linked polyethylene (XLPE) samples containing phenolic and sulfur type antioxidants to study the effects of antioxidants on initiation and growth of electrical trees. The experimental results demonstrated that the phenolic antioxidants in XLPE have the clear effect of suppressing initiation of trees generated under ac voltage stress. Moreover, the results demonstrated that the antioxidants have an effect of inhibiting tree growth. Analyzing the experimental results elucidated the mechanism of electrical tree suppression by antioxidants. It was inferred that the radical trapping effect of the phenolic antioxidant is responsible for preventing tree initiation and growth. Antioxidant effects on the electrical tree generated by grounded dc voltage are also discussed.

引用

页码：661 / 665

页数：5

共 7 条

[1]

DISSADO LA, 1992, ELECT DEGRADATION BR, pCH8

[2]

Hirota K., 2000, Transactions of the Institute of Electrical Engineers of Japan, Part A, V120-A, P154

[3]

*IEEJ, 1998, 674 IEEJ

[4]

OKATSU Y, 1997, TOTAL TECHNOLOGY POL

[5]

Scott G.e., 1993, Atmospheric Oxidation and Antioxidants, VII, DOI [10.1016/B978-0-444-89616-2.50007-0, DOI 10.1016/B978-0-444-89616-2.50007-0]

[6] The effect of inclusions in XLPE insulations on electrical trees generated by AC and grounded DC voltage [J].

Sekii, Y ;

Maruta, K ;

Okada, T .

PROCEEDINGS OF THE 1998 IEEE INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS - ICSD '98, 1998, :317-320

[7] Effects of antioxidants on electrical tree generation in XLPE [J].

Sekii, Y ;

Hirota, K ;

Chizuwa, N .

ICSD '01: PROCEEDINGS OF THE 2001 IEEE 7TH INTERNATIONAL CONFERENCE ON SOLID DIELECTRICS, 2001, :460-464

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