Opto-electronic properties of HfO2: A first principle-based spin-polarized calculations

被引:14
作者
Kumar, Manish [1 ]
Singh, Rishi P. [2 ,3 ]
Kumar, Arvind [1 ]
机构
[1] Univ Delhi, Dept Phys, ARSD Coll, Mat Sci Res Lab Theory & Expt, New Delhi, India
[2] SSV Coll, Dept Phys, Hapur, India
[3] CCS Univ, Meerut, Uttar Pradesh, India
来源
OPTIK | 2021年 / 226卷
关键词
DFT; Opto-electronic properties; DOS; Band structure; Dielectric function; Refractive index; HAFNIUM OXIDE NANOPARTICLES; OPTICAL-PROPERTIES; THERMODYNAMIC STABILITY; THIN-FILM; DEPOSITION; OXIDATION; CONTACT; ZRO2;
D O I
10.1016/j.ijleo.2020.165937
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Wide band gap and highly dielectric, HfO2 compound has been investigated for two different phases viz. cubic and monoclinic using density functional theory (DFT) calculations to study structural and optoelectronic properties. For the calculations, PBE-GGA and Tb-mBJ exchange correlations have been used. Volume optimization curve confirmed that the monoclinic phase is most stable as compared to the cubic one, which is consistent with its experimental outcome. Both density of states (DOS) and band structure profile represent the wide band gap for the HfO2 compound, having the gap in the range of 5.4-5.8 eV for the cubic and monoclinic phase of HfO2 compound under the TB-mBJ potential. The observed bandgap matches greatly with its experimental and other theoretical investigations on HfO2 compound. In addition,we investigated the different optical parameters such as dielectric function, refractive index, extinction coefficient, absorption coefficient, optical conductivity, reflectivity and electron energy loss in detail for the HfO2 compound. The maximum value of the dielectric constant found to be similar to 2.89 at zero frequency. Estimated refractive index found to be similar to 1.7, which validates the standard Penn Model. Our calculations show a high static dielectric constant for the HfO2 compound. Absorption found to be maximum in UV region of em radiation, which is suitable for its application in UV based devices. It is noted that the estimated optical parameters, along with electronic properties, are in good agreement with experimental and theoretical studies.
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页数:12
相关论文
共 53 条
[21]   SELF-CONSISTENT ELECTRONIC-STRUCTURE OF FEAL [J].
KOENIG, C ;
KHAN, MA .
PHYSICAL REVIEW B, 1983, 27 (10) :6129-6135
[22]   SELF-CONSISTENT EQUATIONS INCLUDING EXCHANGE AND CORRELATION EFFECTS [J].
KOHN, W ;
SHAM, LJ .
PHYSICAL REVIEW, 1965, 140 (4A) :1133-&
[23]   Dielectric properties of noncrystalline HfSiON [J].
Koike, M ;
Ino, T ;
Kamimuta, Y ;
Koyama, M ;
Kamata, Y ;
Suzuki, M ;
Mitani, Y ;
Nishiyama, A .
PHYSICAL REVIEW B, 2006, 73 (12)
[24]   Nonlinear optical response of wurtzite ZnO from first principles [J].
Kong, Fanjie ;
Jiang, Gang .
PHYSICA B-CONDENSED MATTER, 2009, 404 (16) :2340-2344
[25]   Synthesis of monoclinic and cubic (metastable) nanocrystalline HfO2 through the nitrate fusion technique [J].
Kumar, D. Sanjay ;
Ananthasivan, K. ;
Krishnan, R. Venkata ;
Amirthapandian, S. ;
Ravindran, T. R. ;
Barakrishnan, S. .
CERAMICS INTERNATIONAL, 2017, 43 (15) :12623-12632
[26]   Optical properties of monoclinic HfO2 studied by first-principles local density approximation plus U approach [J].
Li, Jinping ;
Han, Jiecai ;
Meng, Songhe ;
Lu, Hantao ;
Tohyama, Takami .
APPLIED PHYSICS LETTERS, 2013, 103 (07)
[27]   Relative stability of ZrO2 and HfO2 structural phases [J].
Lowther, JE ;
Dewhurst, JK ;
Leger, JM ;
Haines, J .
PHYSICAL REVIEW B, 1999, 60 (21) :14485-14488
[28]   Effect of Pre-Deposition Annealing on the Performance of MIS Capacitor Formed using Atomic Layer Deposition of Ultrathin HfO2 [J].
Maurya, Savita ;
Singh, B. R. ;
Radhakrishna, M. .
PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS & MATERIAL SCIENCE (RAM 2013), 2013, 1536 :1159-1160
[29]  
Mendoza-Mendoza O, 2015, MATER LETT, V159, P520
[30]   Relationship between structure and optical properties in rare earth-doped hafnium and silicon oxides: Modeling and spectroscopic measurements [J].
Monteil, A. ;
El-Jouad, M. ;
Alombert-Goget, G. ;
Chaussedent, S. ;
Gaumer, N. ;
Mahot, A. ;
Chiasera, A. ;
Jestin, Y. ;
Ferrari, M. .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2008, 354 (42-44) :4719-4722