Covariance-Based Vector-Network-Analyzer Uncertainty Analysis for Time- and Frequency-Domain Measurements

被引:66
|
作者
Lewandowski, Arkadiusz [1 ]
Williams, Dylan F. [2 ]
Hale, Paul D. [2 ]
Wang, Jack C. M. [2 ]
Dienstfrey, Andrew [2 ]
机构
[1] Warsaw Univ Technol, Inst Elect Syst, PL-00665 Warsaw, Poland
[2] NIST, Boulder, CO 80305 USA
关键词
Covariance matrix; frequency-domain measurements; scattering parameters; time-domain measurements; uncertainty analysis; vector network analyzer (VNA); ONLINE ACCURACY ASSESSMENT; DUAL 6-PORT ANA; CALIBRATION;
D O I
10.1109/TMTT.2010.2049768
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We develop a covariance-matrix-based uncertainty analysis for vector-network-analyzer (VNA) scattering-parameter measurements. The covariance matrix not only captures all of the measurement uncertainties of the scattering-parameter measurements, but also the statistical correlations between them. This allows the uncertainties of VNA scattering-parameter measurements to be propagated into the uncertainties of other quantities derived from scattering parameters, including temporal waveforms and circuit model parameters.
引用
收藏
页码:1877 / 1886
页数:10
相关论文
共 50 条
  • [1] UNCERTAINTY ANALYSIS OF COVARIANCE MATRIX BASED VECTOR NETWORK ANALYZER FOR Z-PARAMETER MEASUREMENTS
    Guban, V. G.
    Savin, A. A.
    2014 24TH INTERNATIONAL CRIMEAN CONFERENCE MICROWAVE & TELECOMMUNICATION TECHNOLOGY (CRIMICO), 2014, : 898 - 899
  • [2] On time- and frequency-domain equivalence for compliant EMI measurements
    Mariscotti, Andrea
    2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5, 2007, : 535 - 539
  • [3] Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements
    Lewandowski, Arkadiusz
    Wiatr, Wojciech
    Williams, Dylan
    40TH EUROPEAN MICROWAVE CONFERENCE, 2010, : 260 - 263
  • [4] Ultrahigh-resolution optical vector analyzer for multiple parallel measurements based on frequency-domain analysis
    Wang, Bin
    Fan, Xinyu
    Zhao, Shuangxiang
    Zhang, Weifeng
    OPTICS LETTERS, 2022, 47 (09) : 2318 - 2321
  • [5] Time- and frequency-domain measurements of carrier lifetimes in GaN epilayers
    Tamulaitis, G.
    Mickevicius, J.
    Vitta, P.
    Zukauskas, A.
    Shur, M. S.
    Fareed, Q.
    Gaska, R.
    SUPERLATTICES AND MICROSTRUCTURES, 2006, 40 (4-6) : 274 - 278
  • [6] LFT uncertain model validation with time- and frequency-domain measurements
    Xu, DM
    Ren, Z
    Gu, GX
    Chen, J
    IEEE TRANSACTIONS ON AUTOMATIC CONTROL, 1999, 44 (07) : 1435 - 1441
  • [7] Measurement Uncertainty Introduced by Instruments in Frequency Domain Channel Measurement Systems with a Covariance-Based Analysis
    Zhou, Xin
    Zhong, Zhangdui
    Bian, Xin
    Xiong, Lei
    Guan, Ke
    He, Ruisi
    Liu, Ke
    Wu, Jianqiang
    2015 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2015, : 302 - 305
  • [8] Multiscale Time- and Frequency-domain Likelihood Analysis with Photon Weights
    Kerr, M.
    ASTROPHYSICAL JOURNAL, 2019, 885 (01):
  • [9] Time- and frequency-domain analysis of fluorescence lifetime for temperature sensors
    Fernicola, VC
    Rosso, L
    2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, 2000, : 587 - 588
  • [10] UNCERTAINTY ANALYSIS FOR MATERIAL MEASUREMENTS USING THE VECTOR NETWORK ANALYZER
    Shoaib, Nosherwan
    Sellone, Marco
    Brunetti, Luciano
    Oberto, Luca
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2016, 58 (08) : 1841 - 1844