Experimental and theoretical investigation of the pyroelectric effect of the p-n junction in a paraelectric non-polar semiconductor

被引:2
|
作者
Butenko, A. V. [2 ]
Sandomirsky, V. [2 ]
Kahatabi, R. [2 ]
Dashevsky, Z. [3 ]
Kasiyan, V. [3 ]
Zalevsky, Z. [1 ]
Schlesinger, Y. [2 ]
机构
[1] Bar Ilan Univ, Sch Engn, IL-52900 Ramat Gan, Israel
[2] Bar Ilan Univ, Dept Phys, IL-52900 Ramat Gan, Israel
[3] Ben Gurion Univ Negev, Dept Mat Engn, IL-84105 Beer Sheva, Israel
关键词
Pyroelectric effect; Paraelectric semiconductor; p-n Junction; PIEZOELECTRICITY; PBTE;
D O I
10.1016/j.physb.2011.11.012
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We describe here the first comprehensive investigation of a pyroelectric response of a p-n junction in a non-polar paraelectric semiconductor. The pyroelectric effect is generated by the, temperature dependent, built-in electrical dipole moment. High quality PbTe p-n junctions have been prepared specifically for this experiment. The pyroelectric effect was excited by a continuous CO2 laser beam, modulated by a mechanical chopper. The shape and amplitude of the periodic and single-pulse pyroelectric signals were studied as a function of temperature (10-130 K), reverse bias voltage (up to -500 mV) and chopping frequency (4-2000 Hz). The pyroelectric coefficient is approximate to 10(-3) mu C/cm(2)K in the temperature region 40-80 K. The developed theoretical model quantitatively describes all the experimental features of the observed pyroelectric effect. The time evolution of the temperature within the p-n junction was reconstructed. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:439 / 450
页数:12
相关论文
共 50 条
  • [31] EFFECT OF IMPURITY RADIATION ON CAPACITANCE OF A P-N JUNCTION
    KOTINA, IM
    MAZURIK, NE
    NOVIKOV, SR
    KHUSAINO.AK
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1969, 3 (03): : 319 - +
  • [32] Theoretical investigation of electronic and thermoelectric properties of single-wall carbon nanotube p-n junction
    Zhao, Xiao-Juan
    He, Qing-Li
    PHYSICS LETTERS A, 2012, 376 (47-48) : 3641 - 3644
  • [33] Theoretical analysis of transient processes in lateral P-N junction photodiodes
    Tsutsui, N
    Khmyrova, I
    Ryzhii, V
    Vaccaro, PO
    Taniyama, H
    Aida, T
    2001 INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS, CONFERENCE PROCEEDINGS, 2001, : 158 - 161
  • [34] Investigation of the Fano Resonance in the Cross Section of a Semiconductor Structure with a p-n Junction Formed in a Porous Silicon Film
    Melnik, N. N.
    Tregulov, V. V.
    Skoptsova, G. N.
    Ivanov, A. I.
    Kostsov, D. S.
    BULLETIN OF THE LEBEDEV PHYSICS INSTITUTE, 2023, 50 (07) : 290 - 293
  • [35] EFFECT OF p-n COUPLING ON THE OPEN CIRCUIT VOLTAGE DECAY IN A p-n JUNCTION DEVICE.
    Madan, M.K.
    Tewary, V.K.
    Indian Journal of Pure and Applied Physics, 1985, 23 (04): : 212 - 216
  • [36] A Theoretical Treatment of THz Resonances in Semiconductor GaAs p-n Junctions
    Janipour, Mohsen
    Misirlioglu, I. Burc
    Sendur, Kursat
    MATERIALS, 2019, 12 (15)
  • [37] FREQUENCY-CONTRAST CHARACTERISTIC OF A SEMICONDUCTOR PHOTOGRAPHIC SYSTEM WITH A P-N JUNCTION
    GRINBERG, AA
    KRAMER, NI
    PARITSKI.LG
    UDOD, LV
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1971, 4 (10): : 1640 - &
  • [38] Electrochemical investigations of p-n junction and copper deposition on semiconductor silicon wafers
    Cheng, Xuan
    Lin, Changjian
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2000, 21 (05): : 509 - 516
  • [39] SEMICONDUCTOR P-N JUNCTION LASERS IN INAS1-XSBX SYSTEM
    BASOV, NG
    DUDENKOV.AV
    KRASILNI.AI
    NIKITIN, VV
    FEDOSEEV, DP
    SOVIET PHYSICS SOLID STATE,USSR, 1966, 8 (04): : 847 - +
  • [40] Semiconductor research - Near-field microscope images p-n junction
    Mortensen, P
    LASER FOCUS WORLD, 1997, 33 (05): : 62 - &