Carrier leakage in Ge/Si core-shell nanocrystals for lasers: core size and strain effects

被引:2
|
作者
Neupane, Mahesh R. [1 ]
Rahman, Rajib [2 ]
Lake, Roger K. [1 ]
机构
[1] Univ Calif Riverside, Dept Elect Engn, Riverside, CA 92521 USA
[2] Sandia Natl Labs, Albuquerque, NM 87185 USA
来源
NANOENGINEERING: FABRICATION, PROPERTIES, OPTICS, AND DEVICES VIII | 2011年 / 8102卷
基金
美国能源部; 美国国家科学基金会;
关键词
Ge/Si QD; Laser; oscillator strength; thermionic lifetime; leakage current; QUANTUM;
D O I
10.1117/12.894153
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The electronic structure and optical properties of Ge-core/Si-shell nanocrystal or quantum dot (QD) are investigated using the atomistic tight binding method as implemented in NEMO3D. The thermionic lifetime that governs the hole leakage mechanism in the Ge/Si QD based laser, as a function of the Ge core size and strain, is also calculated by capturing the bound and extended eigenstates, well below the band edges. We also analyzed the effect of core size and strain on optical properties such as transition energies and transition rates between electron and hole states. Finally, a quantitative and qualitative analysis of the leakage current due to the hole leakage through the Ge-core/Si-shell QD laser, at different temperatures and Ge core sizes, is presented.
引用
收藏
页数:8
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