Many-Body Effect and Device Performance Limit of Monolayer InSe

被引:123
作者
Wang, Yangyang [1 ]
Fei, Ruixiang [2 ,3 ]
Quhe, Ruge [7 ,8 ]
Li, Jingzhen [4 ,5 ]
Zhang, Han [4 ,5 ]
Zhang, Xiuying [4 ,5 ]
Shi, Bowen [4 ,5 ]
Xiao, Lin [1 ]
Song, Zhigang [4 ,5 ]
Yang, Jinbo [4 ,5 ,6 ]
Shi, Junjie [4 ,5 ]
Pan, Feng [9 ]
Lu, Jing [4 ,5 ,6 ]
机构
[1] China Acad Space Technol, Nanophoton & Optoelect Res Ctr, Qian Xuesen Lab Space Technol, Beijing 100094, Peoples R China
[2] Washington Univ, Dept Phys, St Louis, MO 63130 USA
[3] Washington Univ, Inst Mat Sci & Engn, St Louis, MO 63130 USA
[4] Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China
[5] Peking Univ, Sch Phys, Beijing 100871, Peoples R China
[6] Collaborat Innovat Ctr Quantum Matter, Beijing 100871, Peoples R China
[7] Beijing Univ Posts & Telecommun, State Key Lab Informat Photon & Opt Commun, Beijing 100876, Peoples R China
[8] Beijing Univ Posts & Telecommun, Sch Sci, Beijing 100876, Peoples R China
[9] Peking Univ, Shenzhen Grad Sch, Sch Adv Mat, Shenzhen 518055, Peoples R China
基金
中国国家自然科学基金;
关键词
many-body effect; transistor; sub-10; nm; density functional theory; quantum transport; FIELD-EFFECT TRANSISTORS; BLACK PHOSPHORUS TRANSISTORS; ELECTRON-MOBILITY; CARRIER MOBILITY; QUASI-PARTICLE; TRANSPORT; SCATTERING; VAN;
D O I
10.1021/acsami.8b06427
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Due to a higher environmental stability than few-layer black phosphorus and a higher carrier mobility than few-layer dichalcogenides, two-dimensional (2D) semiconductor InSe has become quite a promising channel material for the next-generation field-effect transistors (FETs). Here, we provide the investigation of the many-body effect and transistor performance scaling of monolayer (ML) InSe based on ab initio GW-Bethe-Salpeter equation approaches and quantum transport simulations, respectively. The fundamental band gap of ML InSe is indirect and 2.60 eV. The optical band gap of ML InSe is 2.50 eV for the in-plane polarized light, with the corresponding exciton binding energy of 0.58 eV. The ML InSe metal oxide semiconductor FETs (MOSFETs) show excellent performances with reduced short-channel effects. The on-current, delay time, and dynamic power indicator of the optimized n- and p-type ML InSe MOSFETs can satisfy the high-performance and low-power requirements of the International Technology Roadmap for Semiconductors 2013 both down to 3-5 nm gate length in the ballistic limit. Therefore, a new avenue is opened to continue Moore's law down to 3 nm by utilizing 2D InSe.
引用
收藏
页码:23344 / 23352
页数:9
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