A HIGH ORDER INTEGRAL SPM FOR THE CONDUCTING ROUGH SURFACE SCATTERING WITH THE TAPERED WAVE INCIDENCE-TE CASE

被引：33

作者：

Guo, L. -X. ^{[1
]}

Liang, Y. ^{[1
]}

Li, J. ^{[1
]}

Wu, Z. -S. ^{[1
]}

机构：

[1] Xidian Univ, Sch Sci, Xian, Shaanxi, Peoples R China

来源：

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER | 2011年 / 114卷

基金：

中国国家自然科学基金;

关键词：

SMALL-PERTURBATION METHOD; ELECTROMAGNETIC SCATTERING; SEA-SURFACE; 3-DIMENSIONAL SCATTERING; VALIDITY; MEDIA; MODEL;

D O I：

10.2528/PIER11011605

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Based on the Helmholtz integral equation and series expansion theory, a high order integral small perturbation method (HISPM) for studying electromagnetic wave scattering from the finite conducting rough surface with tapered transverse electric (TE) wave incidence is presented. The high order scattering coefficients are obtained by the series expansion, the validity and accuracy of HISPM is verified through numerical evaluation with classical small perturbation method (CSPM) and the method of moments (MOM) By comparing with CSPM for the infinite rough surface case with plane wave incidence, the presented HISPM can greatly reduce the edge diffraction effect. HISPM also shows advantages in the memory requirement and computational time, especially in calculating scattering coefficients with low grazing angle incidence. Numerical examples are given to show that with the increasing of the length of the rough surface, the memory requirements and the computation time of HISPM are dramatically reduced compared to those of MOM.

引用

页码：333 / 352

页数：20

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[2]

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