Optical characterization of thermally evaporated thin CdO films

被引:100
|
作者
Dakhel, AA [1 ]
Henari, FZ [1 ]
机构
[1] Univ Bahrain, Coll Sci, Dept Phys, Isa Town, Bahrain
关键词
cadmium oxide thin films; thermal evaporation; x-ray; wide ban gap; optical properties; optical non-linearity; optical limiting; z-scan;
D O I
10.1002/crat.200310124
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Cadmium Oxide films have been prepared by vacuum evaporation method on a glass substrate at room temperature. Detailed structural, optical, and electrical properties of the films are presented at different annealing temperatures. The crystal structure of the samples was studied by X-ray diffraction. The spectral absorption coefficient of the CdO film at the fundamental absorption region (450-650nm) was determined using the spectral data of transmittance. The direct and indirect band gap energies were determined and found to be 2.33 eV and 1.95 eV respectively. The third order optical nonlinearities chi((3)) of CdO films has been measured used the z-can technique. The real and imaginary parts of chi((3)) have been measured at 514 nm and found to be 1.7 x 10(-3) esu and 3.0 x 10(-3) esu, respectively. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:979 / 985
页数:7
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