Review article on Analytical Models for Single Gate and Double Gate MOSFETs in Subthreshold Regime

被引:0
作者
Duggal, Dhriti [1 ]
Sharma, Rajnish [1 ]
机构
[1] Chitkara Univ, ECE Dept, Chandigarh, India
来源
2016 INTERNATIONAL CONFERENCE ON MICROELECTRONICS, COMPUTING AND COMMUNICATIONS (MICROCOM) | 2016年
关键词
MOSFETs; short channel effects; scale length; Poisson's equation; voltage doping transformation; THRESHOLD VOLTAGE MODEL; CHANNEL; DG; SI; CAPACITANCE; LIMITS; BULK;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
In this review paper, various articles published in the last few years related to analytical models for Short Channel Effects (SCEs) in MOSFETS have been reviewed. In the first half of the paper, single gate MOSFET models have been examined which have been broadly classified into five categories namely a) charge sharing models, b) empirical SCE models, c) polynomial potential models, d) analytical models to 2-D Poisson's equation and e) voltage doping transformation (VDT) models. Limitations of the various available models in these categories have been highlighted. In the second half of the paper double gate MOSFET models based on a) 1-D Poisson's Equation b) 2-D Poisson's Equation and c) voltage doping transformation (VDT) have been detailed along with the limitations of each of these.
引用
收藏
页数:5
相关论文
共 50 条
[22]   Subthreshold Behavior Models for Nanoscale Short-Channel Junctionless Cylindrical Surrounding-Gate MOSFETs [J].
Li, Cong ;
Zhuang, Yiqi ;
Di, Shaoyan ;
Han, Ru .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (11) :3655-3662
[23]   Drain current model for nanoscale double-gate MOSFETs [J].
Hariharan, Venkatnarayan ;
Thakker, Rajesh ;
Singh, Karmvir ;
Sachid, Angada B. ;
Patil, M. B. ;
Vasi, Juzer ;
Rao, V. Ramgopal .
SOLID-STATE ELECTRONICS, 2009, 53 (09) :1001-1008
[24]   Review of radiation effects in single and multiple-gate SOI MOSFETs [J].
Cristoloveanu, S .
SCIENCE AND TECHNOLOGY OF SEMICONDUCTOR-ON-INSULATOR STRUCTURES AND DEVICES OPERATING IN A HARSH ENVIRONMENT, 2005, 185 :197-214
[25]   Analytical modeling of subthreshold characteristics of ion-implanted symmetric double gate junctionless field effect transistors [J].
Singh, Balraj ;
Gola, Deepti ;
Singh, Kunal ;
Goel, Ekta ;
Kumar, Sanjay ;
Jit, Satyabrata .
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2017, 58 :82-88
[26]   Two-dimensional analytical models for the symmetrical triple-material double-gate strained Si MOSFETs [J].
Xin Yan-Hui ;
Liu Hong-Xia ;
Wang Shu-Long ;
Fan Xiao-Jiao .
ACTA PHYSICA SINICA, 2014, 63 (14)
[27]   Quasi-3D subthreshold current and subthreshold swing models of dual-metal quadruple-gate (DMQG) MOSFETs [J].
Samoju, Visweswara Rao ;
Dubey, Sarvesh ;
Tiwari, Pramod Kumar .
JOURNAL OF COMPUTATIONAL ELECTRONICS, 2015, 14 (02) :582-592
[28]   Subthreshold current modeling for fully depleted short channel double-gate MOSFETs with consideration of structure asymmetry [J].
Liu, Xi ;
Jin, Xiaoshi ;
Lee, Jong-Ho .
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2014, 27 (5-6) :875-882
[29]   A rigorous simulation based study of gate misalignment effects in gate engineered double-gate (DG) MOSFETs [J].
Sarangi, Santunu ;
Bhushan, Shiv ;
Santra, Abirmoya ;
Dubey, Sarvesh ;
Jit, Satyabrata ;
Tiwari, Pramod Kumar .
SUPERLATTICES AND MICROSTRUCTURES, 2013, 60 :263-279
[30]   Unified Drain Current Model for Independently Driven Double Gate MOSFETs [J].
Syamal, Binit ;
Sarkar, C. K. ;
Dutta, Pradipta ;
Mohankumar, N. .
2010 INTERNATIONAL CONFERENCE ON MICROELECTRONICS, 2010, :44-47