Preferred crystal orientation of NiFe underlayers and its effect on magnetostriction of Co/Cu/Co thin films

被引:0
作者
Yeh, T
Sivertsen, JM
Lin, CL
机构
[1] Honeywell Inc, Solid State Elect Ctr, Plymouth, MN 55441 USA
[2] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
[3] Headway Technol, Milpitas, CA 95035 USA
关键词
D O I
10.1109/20.706295
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The saturation magnetostriction of sputtered Co/Cu/Co thin films affected by preferred crystal orientation distribution of NiFe underlayers has been investigated, The experimental results indicated that preferred crystal orientation of NiFe underlayers plays a significant role in affecting the magnetoelastic behavior of coupled Co films separated by a thin Cu film. Negative value of saturation magnetostriction (-4.9x10(-6)) was obtained on sample film deposited on the NiFe underlayer with a more random crystal orientation distribution, while positive value of saturation magnetostriction (+11.6x10(-6)) was found on sample film deposited on highly [111] oriented NiFe film. It is clear that the preferred crystal orientation distribution of NiFe underlayers has a marked effect on the saturation magnetostriction of Co/Cu/Co films that lambda(s) is very sensitive to film structure and crystalline orientation texture.
引用
收藏
页码:870 / 872
页数:3
相关论文
共 6 条
[1]  
Bozorth R. M., 1951, FERROMAGNETISM
[2]  
Cullity B.D., 1972, INTRO MAGNETIC MAT, P275
[3]  
LIN CL, J MAGN MAGN MAT, V155, P168
[4]  
MATSUOKA M, 1986, ELECT COMMUNICATIO 2, V69
[5]   PRECISE MEASUREMENTS OF A MAGNETOSTRICTION COEFFICIENT OF A THIN SOFT-MAGNETIC FILM DEPOSITED ON A SUBSTRATE [J].
TAM, AC ;
SCHROEDER, H .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (10) :5422-5424
[6]  
Yeh T, 1995, MATER RES SOC SYMP P, V384, P233, DOI 10.1557/PROC-384-233