Metal catalyst particle imaging with field-emission TEM: electron holography and STEM

被引：0

|

作者：

Disko, MM ^{[1
]}

Orchowski, A ^{[1
]}

Kliewer, CE ^{[1
]}

机构：

[1] Exxon Res & Dev Co, Annandale, NJ 08801 USA

来源：

ELECTRON MICROSCOPY 1998, VOL 2: MATERIALS SCIENCE 1 | 1998年

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：387 / 388

页数：2

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