Metal catalyst particle imaging with field-emission TEM: electron holography and STEM

被引：0
|
作者：
Disko, MM [1 ]
Orchowski, A [1 ]
Kliewer, CE [1 ]
机构：
[1] Exxon Res & Dev Co, Annandale, NJ 08801 USA
来源：
ELECTRON MICROSCOPY 1998, VOL 2: MATERIALS SCIENCE 1 | 1998年
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D O I：
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：387 / 388
页数：2
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