Ductile-brittle transition in micropillar compression of GaAs at room temperature

被引:115
作者
Oestlund, Fredrik [1 ]
Howie, Philip R. [2 ]
Ghisleni, Rudy [1 ]
Korte, Sandra [2 ]
Leifer, Klaus [3 ]
Clegg, William J. [2 ]
Michler, Johann [1 ]
机构
[1] EMPA Swiss Fed Labs Mat Testing & Res, Lab Mech Mat & Nanostruct, CH-3602 Thun, Switzerland
[2] Dept Mat Sci & Met, Gordon Lab, Cambridge CB2 3QZ, England
[3] Uppsala Univ, Dept Engn Sci, SE-75121 Uppsala, Sweden
基金
英国工程与自然科学研究理事会;
关键词
micropillar compression; GaAs; fracture; compression test; scanning electron microscopy; TRANSMISSION ELECTRON-MICROSCOPY; PLASTIC-DEFORMATION; SINGLE-CRYSTALS; MECHANICAL-PROPERTIES; FRACTURE; INDENTATION; NANOINDENTS; STRENGTH; DAMAGE; SI;
D O I
10.1080/14786435.2010.509286
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Experiments have been carried out on how compressive failure of < 100 > axis GaAs micropillars at room temperature is influenced by their diameter. Slip was observed in all micropillars, often on intersecting slip planes. Cracks could nucleate at these intersections and then grow axially in the sample, with bursts of crack growth. However, GaAs micropillars with diameters less than approximately 1 mu m did not split, nor was splitting observed where slip occurred on only one plane. The conditions under which such splitting can occur have been estimated by modifying an existing analysis. This predicts a ductile-brittle transition at a micropillar diameter of approximately 1 mu m, consistent with experimental observations.
引用
收藏
页码:1190 / 1199
页数:10
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