Measurement of in-grain orientation gradients by EBSD and comparison with finite element results

被引：16

作者：

Delannay, L

Logé, RE

Chastel, Y

Signorelli, JW

Van Houtte, P

机构：

[1] Catholic Univ Louvain, Sci Collaborat FNRS Cesame, B-1348 Louvain, Belgium

[2] Ecole Mines Paris, UMR CNRS 7635, CEMEF, F-06904 Sophia Antipolis, France

[3] Consejo Nacl Invest Cient & Tecn, Inst Fis Rosario, RA-2000 Rosario, Argentina

[4] Katholieke Univ Leuven, MTM, B-3001 Heverlee, Belgium

来源：

ADVANCED ENGINEERING MATERIALS | 2003年 / 5卷 / 08期

关键词：

D O I：

10.1002/adem.200300376

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.

引用

页码：597 / 600

页数：4

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