UV EMISSION OF TETRAGONAL ZrO2 NANOCRYSTALS EMBEDDED IN ZrSiO4 AMORPHOUS MATRIX

被引：1
作者：
Ge, Zhongyang [1 ,2 ]
Zhou, Yue [1 ,2 ]
Yin, Jiang [1 ,2 ]
Gong, Youpin [1 ,3 ]
Lv, Shicheng [1 ,2 ]
Xia, Yidong [1 ,3 ]
Liu, Zhiguo [1 ,3 ]
机构：
[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
[3] Nanjing Univ, Dept Mat Sci & Engn, Nanjing 210093, Peoples R China
来源：
MODERN PHYSICS LETTERS B | 2010年 / 24卷 / 24期
基金：
中国国家自然科学基金;
关键词：
PL spectrum; nanocrystals; phase separation; pulsed laser deposition; PHASE-TRANSFORMATION; PHOTOLUMINESCENCE; DEPOSITION; STABILITY;
D O I：
10.1142/S0217984910024869
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Amorphous films Zr0.8Si0.2O2 were deposited on quartz substrates at room temperature, by using pulsed laser deposition technique. After annealing at high temperature, Zr0.8Si0.2O2 films suffer a phase separation to precipitate tetragonal ZrO2 nanocrystals in ZrSiO4 amorphous matrix. Their crystal structure, microstructure, optical absorbance and photoluminescence have been systematically investigated. Tetragonal ZrO2 nanocrystals show intense UV emission around 392 nm under photonic excitation with a wavelength of 250 nm. The corresponding models of electronic excitation and transition related to UV emission also have been proposed.
引用
收藏
页码：2477 / 2483
页数：7
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