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Electrical properties of ZnO nanowire field effect transistors by surface passivation
被引:55
|作者:
Hong, Woong-Ki
Kim, Bong-Joong
Kim, Tae-Wook
Jo, Gunho
Song, Sunghoon
Kwon, Soon-Shin
Yoon, Ahnsook
Stach, Eric A.
Lee, Takhee
[1
]
机构:
[1] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea
[2] Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
[3] Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
关键词:
passivation;
ZnO;
nanowire;
field effect transistor;
nanoelectronics;
D O I:
10.1016/j.colsurfa.2007.04.120
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
We have synthesized single crystalline ZnO nanowires by thermal evaporation method and fabricated individual ZnO nanowire field effect transistors (FETs) to investigate their electrical properties. ZnO nanowires are strongly affected by O-2 molecules in ambient. For example, surface defects such as oxygen vacancies act as adsorption sites of O-2 molecules, and the chemisorption of O-2 molecules depletes the surface electron states and reduces the channel conductivity. Therefore, it is important to protect the electrical properties of ZnO nanowires by surface passivation. For this purpose, we investigated the changes of the electrical properties of ZnO nanowire FETs with and without passivation by an organic material, poly(methyl metahacrylate) (PMMA). The ZnO nanowire FETs with PMMA passivation exhibited better performance in comparison with unpassivated devices. (C) 2007 Elsevier B.V. All rights reserved.
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页码:378 / 382
页数:5
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