Temperature dependence of piezo- and ferroelectricity in ultrathin P(VDF-TrFE) films

被引：8

作者：

Qian, Jun ^{[1
]}

Jiang, Sai ^{[1
]}

Wang, Qijing ^{[1
]}

Yang, Chengdong ^{[1
]}

Duan, Yiwei ^{[1
]}

Wang, Hengyuan ^{[1
]}

Guo, Jianhang ^{[1
]}

Shi, Yi ^{[1
]}

Li, Yun ^{[1
]}

机构：

[1] Nanjing Univ, Natl Lab Solid State Microstruct, Sch Elect Sci & Engn, Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Jiangsu, Peoples R China

来源：

RSC ADVANCES | 2018年 / 8卷 / 51期

关键词：

VINYLIDENE FLUORIDE; POLY(VINYLIDENE FLUORIDE); THICKNESS DEPENDENCE; TRANSISTOR MEMORIES; CRYSTALLINE; ORIENTATION; PHASE; ENHANCEMENT; BEHAVIOR; FIELD;

D O I：

10.1039/c8ra05648j

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The polymer poly(vinylidene fluoride-co-trifluoroethylene) (P(VDF-TrFE)) is highly desirable for piezoelectric and ferroelectric functional applications owing to its considerable electromechanical activity and reliable electrical polarization. However, a clear understanding of the effect of the thermal annealing on the electromechanical behavior and polarization nature of ultrathin crystalline P(VDF-TrFE) films is severely lacking. Here we report the thermally induced structural reorganization, and piezo- and ferroelectric features in the ultrathin P(VDF-TrFE) films. On applying a 40 degrees C annealing treatment, the polarization-patterned electrostrictive strain reaches the highest value of approximate to 53.7 pm. Besides, the ultrathin film exhibits a highly ordered antiparallel dipole alignment, the highest local piezoelectric activity, and an improved polarization relaxation time. The optimum film properties are achieved owing to a high degree of polymer chains oriented parallel to the substrate plane. Our results can reveal a promising avenue for nano-electro-mechanical and nano-ferroelectric electronic applications using ultrathin P(VDF-TrFE) films.

引用

页码：29164 / 29171

页数：8

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