STUDY OF THE STRUCTURAL AND SPECTROSCOPIC PROPERTIES OF TITANIUM OXIDE (TIO2 NPS)

Using a DC reactant magnetron, titanium dioxide nanostructured thin films were created on glass substrates in this study. sputtering method The plasma spraying system's operational parameters were optimized, while the sedimentation duration was varied to find the best conditions for getting high-quality samples. At various Sedimentation periods, single phase (anatase) TiO2 thin films were produced utilizing an Ar:O2 gas mixture in a 50:50 ratio (1, 1:30, 2, 2:30, 3 hours). These thin films' multilayer architectures They were made with the same mixing ratio following a one-hour sedimentation period. X-ray diffraction, atomic force microscopy, and scanning electron microscopy were used to examine the structural properties of the produced samples. The average crystal size of titanium dioxide, nitrogen, and Cu2O samples was 17.74, 22.80, and 22.81 nm, respectively, while the nanoparticles' lowest sizes were 60, 40, and 74 nm, respectively, according to the characterization data. Using an energy-dispersive X-ray spectrometer, the percentage contents of elements in the prepared samples were determined; the results revealed that the prepared samples were structurally pure. The spectral features of the samples created using UV visible light were inferred, as well as FTIR spectra, which supported the structural uniformity of the samples. The advantages of DC reactive magnetron sputtering Technique are to blame for this. Different concentrations of fluorescence and absorption spectra were tested as well.