Properties of Self-Assembled Monolayers Revealed via Inverse Tensiometry

被引:31
作者
Chen, Jiahao [1 ]
Wang, Zhengjia [1 ]
Oyola-Reynoso, Stephanie [1 ]
Thuo, Martin M. [1 ]
机构
[1] Iowa State Univ, Dept Mat Sci & Engn, 2220 Hoover Hall, Ames, IA 50011 USA
关键词
CHAIN-LENGTH DEPENDENCE; WETTING PROPERTIES; SUBSTRATE ROUGHNESS; TUNNELING JUNCTIONS; CHARGE-TRANSPORT; ALKANETHIOLATE MONOLAYERS; PHASE-TRANSITION; METAL-SURFACES; MONO LAYERS; EVEN;
D O I
10.1021/acs.langmuir.7b01937
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Self-assembled monolayers (SAMs) have emerged as a simple platform technology and hence have been broadly studied. With advances in state-of-the-art fabrication and characterization methods, new insights into SAM structure and related properties have been delineated, albeit with some discrepancies and/or incoherencies. Some discrepancies, especially between experimental and theoretical work, are in part due to the misunderstanding of subtle structural features such as phase evolution and SAM quality. Recent work has, however, shown that simple techniques, such as the measurement of static contact angles, can be used to delineate otherwise complex properties of the SAM, especially when complemented by other more advanced techniques. In this article, we highlight the effect of nanoscale substrate asperities and molecular chain length on the SAM structure and associated properties. First, surfaces with tunable roughness are prepared on both Au and Ag, and their corresponding n-alkanethiolate SAMs are characterized through wetting and spectroscopy. From these data, chain-length- and substrate-morphology-dependent limits to the odd even effect (structure and properties vary with the number of carbons in the molecules and the nature of the substrate), parametrization of gauche defect densities, and structural phase evolution (liquidlike, waxy, crystalline interfaces) are deduced. An evaluation of the correlation between the effect of roughness and the components of surface tension (polar-gamma(P) and dispersive-gamma(d)) reveals that wetting, at nanoscale rough surfaces, evolves proportionally with the ratio of the two components of surface tension. The evolution of conformational order is captured over a range of molecular lengths and parametrized through a dimensionless number, chi(c). By deploying a well-known tensiometry technique (herein the liquid is used to characterize the solid, hence the term inverse tensiometry) to characterize SAMs, we demonstrate that complex molecular-level phenomena in SAMs can be understood through simplicity.
引用
收藏
页码:13451 / 13467
页数:17
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