Individuals control schemes for monitoring the mean and variance of processes subject to drifts

被引:33
作者
Reynolds, MR
Stoumbos, ZG
机构
[1] Virginia Polytech Inst & State Univ, Dept Stat, Blacksburg, VA 24061 USA
[2] Virginia Polytech Inst & State Univ, Dept Forestry, Blacksburg, VA 24061 USA
[3] Rutgers State Univ, Rutgers Ctr Operat Res, Dept Management Sci & Informat Syst, Newark, NJ 07102 USA
关键词
exponentially weighted moving average control; charts; Shewhart control charts; statistical process control; steady state; variable sampling interval;
D O I
10.1081/SAP-120000226
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
This paper investigates control chart schemes for detecting drifts in the process mean mu and/or process standard deviation cr when individual observations are sampled. Drifts may be due to causes such as gradual deterioration of equipment, catalyst aging, waste accumulation, or human causes, such as operator fatigue or close supervision. The standard Shewhan X chart and moving range (MR) chart are evaluated. as well as several types of exponentially weighted moving average (EWMA) charts and combinations of charts involving these EWMA charts. We show that the combinations of the EWMA charts detect slow-rate and moderate-rate drifts much faster than the combined X and MR charts. We also show that varying the sampling interval adaptively as a function of the process data results in notable reductions in the detection delay of drifts in mu and/or sigma.
引用
收藏
页码:863 / 892
页数:30
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