Built-in self-test for signal integrity

被引：0

作者：

Nourani, M ^{[1
]}

Attarha, A ^{[1
]}

机构：

[1] Univ Texas, Ctr Integrated Cirucits & Syst, Richardson, TX 75083 USA

来源：

38TH DESIGN AUTOMATION CONFERENCE PROCEEDINGS 2001 | 2001年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Unacceptable loss of signal integrity may harm the functionality of SoCs permanently or intermittently. We propose a systematic approach to model and test signal integrity in deep-submicron highspeed interconnects. Various signal integrity problems occurring on such interconnects (e.g. crosstalk, overshoot, noise, skew, etc.) are considered in a unified model. We also present a test methodology that uses a noise detection circuitry to detect low integrity signals and an inexpensive test architecture to measure and read the statistics for final observation and analysis.

引用

页码：792 / 797

页数：6

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