Improved definition of the effective number of bits in ADC testing

被引：10

作者：

Bellan, D

Brandolini, A

di Rienzo, L

Gandelli, A

机构：

[1] Dipartimento di Elettrotecnica, Politecnico di Milano, 32-20133 Milano, Piazza Leonardo da Vinci

来源：

COMPUTER STANDARDS & INTERFACES | 1998年 / 19卷 / 3-4期

关键词：

quantization error power; Effective Number of Bits (ENOB);

D O I：

10.1016/S0920-5489(98)00011-7

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper deals with the study of the well-known parameter Effective Number Of Bits (ENOB) in ADC testing. Some limits of the ENOB classical definition, related to the variable slope of the sine wave, are shown. Furthermore, the new parameter Linearized ENOB (LENOB), able to overcome these limits, is defined. Finally, numerical simulations and applications are presented to show the effectiveness of this parameter. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：231 / 236

页数：6