Structure and resistivity correlations in Mg2NiH4 studied with in situ X-ray diffraction

被引：16

作者：

Blomqvist, H ^{[1
]}

Noréus, D

Babushkin, O

Nion, F

Vourinen, E

机构：

[1] Stockholm Univ, Dept Struct Chem, S-10691 Stockholm, Sweden

[2] Lulea Univ Technol, Div Engn Mat, S-97187 Lulea, Sweden

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 2003年 / 22卷 / 21期

关键词：

D O I：

10.1023/A:1026142912385

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Structure and resistivity correlations in Mg2NiH4 was studied using in situ X-ray diffraction. Microtwinning was found to be sensitive to the applied mechanical pressure or grinding and by compressing the heated hydride sample in a tablet press. The resistivity increased before the low-temperature→high temperature phase transition.

引用

页码：1487 / 1489

页数：3

共 13 条

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