Electric measurements of nano-scaled devices

被引：8

作者：

Watanabe, H ^{[1
]}

Shimotani, K ^{[1
]}

Shigematu, T ^{[1
]}

Manabe, C ^{[1
]}

机构：

[1] Fuji Xerox Co Ltd, Corp Res Labs, Adv Res Lab, Kanagawa 2590157, Japan

来源：

THIN SOLID FILMS | 2003年 / 438卷

关键词：

transistor; carbon nanotube; atomic force microscope; DNA;

D O I：

10.1016/S0040-6090(03)00806-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Molecular electronics has been wished to be the real one for many researchers. In this paper, we report the electric properties of nano-scaled transistors using a triple-probe atomic force microscope. First, we describe the electric properties of semiconductive carbon nanotube (CNT) rings and metallic ones. The semiconductive small CNT ring connected with CNT terminals can be used for a nano-scaled transistor with size of less than 20 nm. Next, we also fabricated a single DNA molecule device to measure its electric properties as a filed effect transistor. Last, we show the electric conductivity of a single DNA molecule. These results show that the triple-probe atomic force microscope would be a powerful tool for molecular electronics. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：462 / 466

页数：5

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