Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon

被引：40

作者：

Turneaure, Stefan J. ^{[1
]}

Sinclair, N.

Gupta, Y. M.

机构：

[1] Washington State Univ, Inst Shock Phys, Pullman, WA 99164 USA

来源：

PHYSICAL REVIEW LETTERS | 2016年 / 117卷 / 04期

关键词：

HIGH-PRESSURE PHASES; BETA-TIN; TRANSITION; AMORPHIZATION; POLYMORPHISM; SI;

D O I：

10.1103/PhysRevLett.117.045502

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The experimental determination of atomistic mechanisms linking crystal structures during a compression-driven solid-solid phase transformation is a long-standing and challenging scientific objective. Using new capabilities at the Dynamic Compression Sector at the Advanced Photon Source, the structure of shocked Si at 19 GPa was identified as simple hexagonal, and the lattice orientations between ambient cubic diamond and simple hexagonal structures were related. The approach is general and provides a powerful new method for examining atomistic mechanisms during stress-induced structural changes.

引用

页数：5

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