Microstructure-electromechanical property correlations in rare-earth-substituted BiFeO3 epitaxial thin films at morphotropic phase boundaries

被引：75

作者：

Cheng, Ching-Jung ^{[1
]}

Kan, Daisuke ^{[2
]}

Anbusathaiah, Varatharajan ^{[1
]}

Takeuchi, Ichiro ^{[2
]}

Nagarajan, Valanoor ^{[1
]}

机构：

[1] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia

[2] Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USA

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 21期

关键词：

The research at UNSW was supported by an ARC Discovery Project; NEDO; and a DEST ISL grant. The work at Maryland was supported by the UMD-NSF-MRSEC (Grant No. DMR 0520471); ARO (Grant No. W911NF-07-1-0410); and W. M. Keck Foundation;

D O I：

10.1063/1.3520642

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Structure-electromechanical property correlations in rare-earth (RE)-substituted (001) BiFeO3 (BFO) epitaxial thin films have been investigated. Quantitative piezoelectric coefficient (d(33)) and dielectric constant (epsilon(33)) measurements, in conjunction with selected area electron diffraction, reveal that the enhancement in d(33) and epsilon(33) at the morphotropic phase boundary (MPB) of the RE-substituted films (RE=Dy3+, Gd3+, and Sm3+) is correlated with the presence of a competing intermediate antipolar phase with the rhombohedral ferroelectric and nonpolar orthorhombic phase. This leads to a complex nanoscale phase coexistence at the MPB. Extending the studies to RE=La3+ case, we find the nanoscale phase coexistence to be less pronounced. This explains the lack of increase in d(33) for the La3+-substituted BFO films, in contrast to the Dy3+, Gd3+, and Sm3+-substituted films. (C) 2010 American Institute of Physics. [doi:10.1063/1.3520642]

引用

页数：3

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